Share Email Print
cover

Proceedings Paper

Morphology of nanostructured semiconductors studied using atomic force microscopy combined with stochastic signal spectroscopy
Author(s): Vitali P. Parkhutik; Yuri Makushok; Kei Inumaru; Yutaka Harima
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Details

Date Published:
PDF
Proc. SPIE 5472, Noise and Information in Nanoelectronics, Sensors, and Standards II, ; doi: 10.1117/12.547347
Show Author Affiliations
Vitali P. Parkhutik, Univ. Politècnica de València (Spain)
Yuri Makushok, Univ. Politècnica de València (Spain)
Kei Inumaru, Hiroshima Univ. (Japan)
Yutaka Harima, Hiroshima Univ. (Japan)


Published in SPIE Proceedings Vol. 5472:
Noise and Information in Nanoelectronics, Sensors, and Standards II
Janusz M. Smulko; Yaroslav Blanter; Mark I. Dykman; Laszlo B. Kish, Editor(s)

© SPIE. Terms of Use
Back to Top