Share Email Print
cover

Proceedings Paper

Long term stability estimation of DC electrical sources from low frequency noise measurements
Author(s): Carmine Ciofi; Gino Giusi; Calogero Pace
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

An indirect approach for estimating the long term stability of DC electrical sources from low frequency noise measurements is presented and discussed. In particular, it is demonstrated that once the unity frequency magnitude and the frequency exponent of the flicker noise component are determined, an overestimate of the variance of repeated measurements of the source output (averaged over a time interval τ) taken ΔT seconds apart can be readily obtained. The proposed approach is validated with reference to actual experimental data.

Paper Details

Date Published: 25 May 2004
PDF: 10 pages
Proc. SPIE 5470, Noise in Devices and Circuits II, (25 May 2004); doi: 10.1117/12.547137
Show Author Affiliations
Carmine Ciofi, Univ. degli Studi di Messina (Italy)
Gino Giusi, Univ. degli Studi di Messina (Italy)
Calogero Pace, Univ. della Calabria (Italy)


Published in SPIE Proceedings Vol. 5470:
Noise in Devices and Circuits II
Francois Danneville; Fabrizio Bonani; M. Jamal Deen; Michael E. Levinshtein, Editor(s)

© SPIE. Terms of Use
Back to Top