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Proceedings Paper

Phase coexistence and resistance fluctuations in a thin film manganite
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Paper Abstract

Resistance fluctuations of low strain thin film La0.7Ca0.3MnO3 grown on NdGaO3 are examined. The appearance of two state resistance fluctuations are found to be correlated with the onset of remanent magnetization and not with the onset of percolation-like conduction. Their behavior with current, applied magnetic field, and temperature provide information on the nature of the fluctuation. In contrast to the magnetization at the putative Tc of the thin film, the resistance fluctuations display memory of the applied magnetic filed history. An explanation involving a strain enhanced AF interaction is posited.

Paper Details

Date Published: 25 May 2004
PDF: 10 pages
Proc. SPIE 5469, Fluctuations and Noise in Materials, (25 May 2004); doi: 10.1117/12.547132
Show Author Affiliations
Akilan Palanisami, Univ. of Illinois/Urbana-Champaign (United States)
Neil D. Mathur, Univ. of Cambridge (United Kingdom)
Michael B. Weissman, Univ. of Illinois/Urbana-Champaign (United States)


Published in SPIE Proceedings Vol. 5469:
Fluctuations and Noise in Materials
Dragana Popovic; Michael B. Weissman; Zoltan A. Racz, Editor(s)

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