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Proceedings Paper

Non-Gaussian resistance fluctuations in disordered materials
Author(s): Cecilia Pennetta; Eleonora Alfinito; Lino Reggiani; Stefano Ruffo
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Paper Abstract

We study the distribution of resistance fluctuations of conducting thin films with different levels of internal disorder. The film is modeled as a resistor network in a steady state determined by the competition between two biased processes, breaking and recovery of the elementary resistors. The fluctuations of the film resistance are calculated by Monte Carlo simulations which are performed under different bias conditions, from the linear regime up to the threshold for electrical breakdown. Depending on the value of the external current, on the level of disorder and on the size of the system, the distribution of the resistance fluctuations can exhibit significant deviations from Gaussianity. As a general trend, a size dependent, non universal distribution is found for systems with low and intermediate disorder. However, for strongly disordered systems, close to the critical point of the conductor-insulator transition, the non-Gaussianity persists when the size is increased and the distribution of resistance fluctuations is well described by the universal Bramwell-Holdsworth-Pinton distribution.

Paper Details

Date Published: 25 May 2004
PDF: 10 pages
Proc. SPIE 5471, Noise in Complex Systems and Stochastic Dynamics II, (25 May 2004); doi: 10.1117/12.546781
Show Author Affiliations
Cecilia Pennetta, INFM, Univ. degli Studi di Lecce (Italy)
Eleonora Alfinito, INFM, Univ. degli Studi di Lecce (Italy)
Lino Reggiani, INFM, Univ. degli Studi di Lecce (Italy)
Stefano Ruffo, CSDC, INFN (Italy)
INFM, Univ. degli Studi di Firenze (Italy)


Published in SPIE Proceedings Vol. 5471:
Noise in Complex Systems and Stochastic Dynamics II
Zoltan Gingl, Editor(s)

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