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Proceedings Paper

Blind characterization of materials using single-sided thermography
Author(s): Steven M. Shepard; James R. Lhota; Yu Lin Hou; Tasdiq Ahmed
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Paper Abstract

In various studies, thermographic methods have been used to measure thermophysical properties of materials. The most widely used such method is the Parker flash technique for diffusivity measurement, in which the transit time of a heat pulse applied to the front face of a sample of known thickness is measured by observing the temperature at the rear surface. In recent investigations, there has been considerable emphasis on single-sided techniques for materials characterization. Typically, quantitative analysis using a single-sided thermographic approach requires some a priori knowledge about the sample, such as thickness, thermal diffusivity, or perhaps a calibration standard with back drilled holes with known diameter and depth. In fact, in certain cases it is possible to use single side pulsed thermographic data to measure, or at least estimate, properties such as thickness, thermal diffusivity and subsurface feature depth with no a priori information about the sample.

Paper Details

Date Published: 12 April 2004
PDF: 5 pages
Proc. SPIE 5405, Thermosense XXVI, (12 April 2004); doi: 10.1117/12.546596
Show Author Affiliations
Steven M. Shepard, Thermal Wave Imaging, Inc. (United States)
James R. Lhota, Thermal Wave Imaging, Inc. (United States)
Yu Lin Hou, Thermal Wave Imaging, Inc. (United States)
Tasdiq Ahmed, Thermal Wave Imaging, Inc. (United States)


Published in SPIE Proceedings Vol. 5405:
Thermosense XXVI
Douglas D. Burleigh; K. Elliott Cramer; G. Raymond Peacock, Editor(s)

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