Share Email Print

Proceedings Paper

Development of a new processing technique of sequential temperature data after pulse heating for quantitative nondestructive testing
Author(s): Takahide Sakagami; Shiro Kubo; Takeshi Endo; Yoshifumi Asakura
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Pulse thermography has been developed by several researchers as one of effective quantitative thermographic NDT techniques. The interest of the researchers has been focused on how to process transient temperature data after pulse heating to conduct successful identification of defect parameters such as its depth, shape and size. In this paper, a simple thermographic NDT technique termed "Rmax method" is proposed, in which the maximum value of the temperature rise ratio is related to the defect depth. The feasibility of the proposed technique is examined in the quantitative identification of the remaining thickness of the steel plate with corrosive material loss defects. Numerical and experimental investigations were made to obtain the relationships between Rmax and remaining thickness ratio. It was found that the relationship between Rmax and remaining thickness ratio was independent of material’s thermal properties. It was also found that the relationship between Rmax and remaining thickness ratio was not influenced by the size of corrosive material loss defect when the thickness of the plate was thin enough compared to the size of defect. The practicability of the present technique was examined for quantitative identification of actual material loss defects appeared on backside of the steel automobile panel.

Paper Details

Date Published: 12 April 2004
PDF: 9 pages
Proc. SPIE 5405, Thermosense XXVI, (12 April 2004); doi: 10.1117/12.546477
Show Author Affiliations
Takahide Sakagami, Osaka Univ. (Japan)
Shiro Kubo, Osaka Univ. (Japan)
Takeshi Endo, Osaka Univ. (Japan)
Yoshifumi Asakura, Ishikawajima-Harima Heavy Industries Co., Ltd. (Japan)

Published in SPIE Proceedings Vol. 5405:
Thermosense XXVI
Douglas D. Burleigh; K. Elliott Cramer; G. Raymond Peacock, Editor(s)

© SPIE. Terms of Use
Back to Top