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Proceedings Paper

Measurement of the very thin metallic wires diameter for the industrial automatic control
Author(s): Ibrahim Serroukh; J. C. Martinez; Angel Serrano; Eusebio Bernabeu
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Paper Abstract

The accuracy and precision of the thin wires still requiring special attention. Both theoretical and experimental studies together may give closest approximation to the "real" value. Concerning the optical technique of measurement, perhaps one may analyze more in detail the interaction between light and matter (wire) which can lead to a simple mathematical approach. Besides this, a calibrating system and robust technique of measurement is required both in the industrial sector and laboratories. Measuring the wires depends especially on how much accuracy and precision we want to achieve, we have static or dynamic measurement, which kind of wire we need to measure...etc. This report shows some work about the diffraction models and some measurement of the thin wire (30-500 μm). Statistical technique of measurement is provided as well.

Paper Details

Date Published: 10 September 2004
PDF: 9 pages
Proc. SPIE 5457, Optical Metrology in Production Engineering, (10 September 2004); doi: 10.1117/12.545875
Show Author Affiliations
Ibrahim Serroukh, Instituto Tecnologico de Monterrey (Mexico)
J. C. Martinez, Instituto Tecnologico de Monterrey (Mexico)
Angel Serrano, Instituto Tecnologico de Monterrey (Mexico)
Eusebio Bernabeu, Instituto Tecnologico de Monterrey (Mexico)


Published in SPIE Proceedings Vol. 5457:
Optical Metrology in Production Engineering
Wolfgang Osten; Mitsuo Takeda, Editor(s)

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