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Proceedings Paper

Far- and near-field characterization of a photonic-crystal-based microcavity on silicon-on-insulator
Author(s): Benoit Cluzel; Davy Gerard; Emmanuel Picard; Thomas Charvolin; Vincent Calvo; Emmanuel Hadji; Frederique de Fornel
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Paper Abstract

We report the spectroscopic characterisation of an integrated microcavity designed for the 1.5μm telecommunication wavelength by using both near- and far-field techniques. We show the establishment of the cavity mode for wavelengths ranging from the photonic band gap to the resonance by using a scanning near-field optical microscope in collection mode. The respective contributions of out of plane losses and evanescent field are clearly identified. Transmission measurements on a broad spectral range are performed and results obtained by the two techniques are in very good agreement.

Paper Details

Date Published: 15 September 2004
PDF: 7 pages
Proc. SPIE 5450, Photonic Crystal Materials and Nanostructures, (15 September 2004); doi: 10.1117/12.545764
Show Author Affiliations
Benoit Cluzel, CEA Grenoble (France)
Davy Gerard, Lab. de Physique, CNRS and Univ. de Bourgogne (France)
Emmanuel Picard, CEA Grenoble (France)
Thomas Charvolin, CEA Grenoble (France)
Vincent Calvo, CEA Grenoble (France)
Emmanuel Hadji, CEA Grenoble (France)
Frederique de Fornel, Lab. de Physique, CNRS and Univ. de Bourgogne (France)


Published in SPIE Proceedings Vol. 5450:
Photonic Crystal Materials and Nanostructures
Richard M. De La Rue; Pierre Viktorovitch; Clivia M. Sotomayor Torres; Michele Midrio, Editor(s)

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