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Proceedings Paper

Photopolymerization-induced materialization of the dipolar response from isolated metallic nanoparticles
Author(s): Gregory Wurtz; Dominique Burget; Christiane Carre
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Paper Abstract

We report on the characterization of the field diffracted by Au nanoparticles under optical excitation. The spatial distribution of the scattering diagram of the nanoparticles is materialized in real space through photopolymerization. These experiments find their motivations in optics where metallic nanoparticles are thought to find promising applications in plasmonics, but also in chemistry where nanometer scale polymerization mechanisms is a subject of current interest for both fundamental purposes or lithographic applications. For our experiments, the nanoparticles embedded in a photopolymerizable material are deposited on a glass substrate. The sample is then subjected to a global illumination and the field scattered by the particles enables for a local optical activation of the polymerization reaction. The nanometric sensitivity of the polymerization reaction determines the reaction's transfer function and allows for a spatially controlled characterization of the field scattered by the particles. The shape of the resulting polymeric material, representing the particle's spatial diffraction pattern, is subsequently characterized using Atomic Force Microscopy (AFM). For colloidal, randomly dispersed Au nanoparticles excited with linearly polarized light, the scattering induced topography is related to the dipolar response from the particle. More specifically, different components of the scattered field were identified that we assigned to the evanescent and progressive contributions of the dipole's field. Experiments in progress are aimed to study interacting particles with various shapes and sizes.

Paper Details

Date Published: 17 August 2004
PDF: 9 pages
Proc. SPIE 5458, Optical Micro- and Nanometrology in Manufacturing Technology, (17 August 2004); doi: 10.1117/12.545655
Show Author Affiliations
Gregory Wurtz, Ecole Nationale Superieure de Chimie de Mulhouse (France)
Dominique Burget, Ecole Nationale Superieure de Chimie de Mulhouse (France)
Christiane Carre, Ecole Nationale Superieure de Chimie de Mulhouse (France)


Published in SPIE Proceedings Vol. 5458:
Optical Micro- and Nanometrology in Manufacturing Technology
Christophe Gorecki; Anand K. Asundi, Editor(s)

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