Share Email Print

Proceedings Paper

A 3D scanning device for architectural survey based on time-of-flight technology
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

This work is intended to show the results of a few architectural and archaeological surveys realized by means of a 3D scanning device, based on TOF (Time-Of-Flight) technology. The instrument was set up by the Art Diagnostic Group of the National Institute for Applied Optics (INOA) and it is composed by a high precision scanning system equipped with a commercial low-cost distance-meter. This device was projected in order to provide the following characteristics: reliability, good accuracy and compatibility with other systems and it is devoted to applications in Cultural Heritage field.

Paper Details

Date Published: 10 September 2004
PDF: 8 pages
Proc. SPIE 5457, Optical Metrology in Production Engineering, (10 September 2004); doi: 10.1117/12.545629
Show Author Affiliations
Raffaella Fontana, Istituto Nazionale di Ottica Applicata (Italy)
Maria Chiara Gambino, Istituto Nazionale di Ottica Applicata (Italy)
Gabriella Gianfrate, Univ. degli Studi di Lecce (Italy)
Marinella Greco, Istituto Nazionale di Ottica Applicata (Italy)
Enrico Pampaloni, Istituto Nazionale di Ottica Applicata (Italy)
Luca Pezzati, Istituto Nazionale di Ottica Applicata (Italy)

Published in SPIE Proceedings Vol. 5457:
Optical Metrology in Production Engineering
Wolfgang Osten; Mitsuo Takeda, Editor(s)

© SPIE. Terms of Use
Back to Top