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Proceedings Paper

A time-of-flight line sensor: development and application
Author(s): Rolf Kaufmann; Michael Lehmann; Matthias Schweizer; Michael Richter; Peter Metzler; Graham Lang; Thierry Oggier; Nicolas Blanc; Peter Seitz; Gabriel Gruener; Urs Zbinden
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Paper Abstract

A new miniaturised 256 pixel silicon line sensor, which allows for the acquisition of depth-resolved images in real-time, is presented. It reliably and simultaneously delivers intensity data as well as distance information on the objects in the scene. The depth measurement is based on the time-of-flight (TOF) principle. The device allows the simultaneous measurement of the phase, offset and amplitude of a radio frequency modulated light field that is emitted by the system and reflected back by the camera surroundings, without requiring any mechanical scanning parts. The 3D line sensor will be used on a mobile robot platform to substitute the laser range scanners traditionally used for navigation in dynamic and/or unknown environments.

Paper Details

Date Published: 1 September 2004
PDF: 8 pages
Proc. SPIE 5459, Optical Sensing, (1 September 2004); doi: 10.1117/12.545571
Show Author Affiliations
Rolf Kaufmann, Ctr. Suisse d'Electronique et de Microtechnique SA (Switzerland)
Michael Lehmann, Ctr. Suisse d'Electronique et de Microtechnique SA (Switzerland)
Matthias Schweizer, Ctr. Suisse d'Electronique et de Microtechnique SA (Switzerland)
Michael Richter, Ctr. Suisse d'Electronique et de Microtechnique SA (Switzerland)
Peter Metzler, Ctr. Suisse d'Electronique et de Microtechnique SA (Switzerland)
Graham Lang, Ctr. Suisse d'Electronique et de Microtechnique SA (Switzerland)
Thierry Oggier, Ctr. Suisse d'Electronique et de Microtechnique SA (Switzerland)
Nicolas Blanc, Ctr. Suisse d'Electronique et de Microtechnique SA (Switzerland)
Peter Seitz, Ctr. Suisse d'Electronique et de Microtechnique SA (Switzerland)
Gabriel Gruener, Ctr. Suisse d'Electronique et de Microtechnique SA (Switzerland)
Urs Zbinden, Ctr. Suisse d'Electronique et de Microtechnique SA (Switzerland)


Published in SPIE Proceedings Vol. 5459:
Optical Sensing
Brian Culshaw; Anna Grazia Mignani; Rainer Riesenberg, Editor(s)

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