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Proceedings Paper

Infrared focal plane array modeling for aerospace and automotive applications
Author(s): Alain Durand; Eric de Borniol; Nicolas Guerineau; Thierry Cathala; Jean-Jacques Yon; Jean-Louis Ouvrier-Buffet; Pierre Castelein; Robert Tronel; Sylvette Bisotto; Gerard L. Destefanis; Jean-Paul Chamonal
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Paper Abstract

To simulate an Enhanced Vision System (EVS), CEA/LETI Infrared Laboratory has developed two behavioural models of infrared focal plane arrays : one in the Short Wave IR and the other in the Long Wave IR band. These Infrared Focal Plane Arrays (IRFPAs) models will be implemented on simulation platform aimed at evaluating the impact and use of infrared sensors in automotive and aeronautic applications. To be realistic, model parameters are extracted from electro-optical characterization of real components. The SWIR detector is calibrated with a 320x256 HgCdTe cooled FPA component from SOFRADIR, and the LWIR one with an uncooled micro-bolometer array from ULIS (a_Si technology from LETI). The flexibility of the models allows to simulate cameras based on these components and to forecast future ones based on different read-out circuit or detector technologies. In this paper we present the IRFPAs models, the main electro-optical characterization results and we compare some experimental measurements with simulations.

Paper Details

Date Published: 5 August 2004
PDF: 12 pages
Proc. SPIE 5407, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XV, (5 August 2004); doi: 10.1117/12.545426
Show Author Affiliations
Alain Durand, CEA-LETI (France)
Eric de Borniol, CEA-LETI (France)
Nicolas Guerineau, ONERA (France)
Thierry Cathala, OKTAL (France)
Jean-Jacques Yon, CEA-LETI (France)
Jean-Louis Ouvrier-Buffet, CEA-LETI (France)
Pierre Castelein, CEA-LETI (France)
Robert Tronel, CEA-LETI (France)
Sylvette Bisotto, CEA-LETI (France)
Gerard L. Destefanis, CEA-LETI (France)
Jean-Paul Chamonal, CEA-LETI (France)

Published in SPIE Proceedings Vol. 5407:
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XV
Gerald C. Holst, Editor(s)

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