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Proceedings Paper

Light-scattered measurements using Fourier optics: a new tool for surface characterization
Author(s): Pierre Boher; Mathieu Luet; Thierry Leroux
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Paper Abstract

We present a new way to obtain a precise and rapid characterization of the BRDF of a surface using Fourier optics. A special optical setup with Fourier optics allows us to measure the entire scattering pattern of the sample very rapidly with a large angular aperture both in incidence (0 to 80°) and azimuth (0 to 360°) using a CCD camera. The sample is illuminated true the same optics at fixed wavelength or with white light. The illumination angles can be controlled easily using the Fourier optics. The measurement spot size can be adapted from 100µm to 2mm. Anti blooming detector and multi exposures allow measurements with good signal/noise ratios very rapidly. The instrument is described and results on unprinted and printed paper are presented in relation with other more standard characterizations.

Paper Details

Date Published: 10 September 2004
PDF: 11 pages
Proc. SPIE 5457, Optical Metrology in Production Engineering, (10 September 2004); doi: 10.1117/12.545390
Show Author Affiliations
Pierre Boher, ELDIM (France)
Mathieu Luet, ELDIM (France)
Thierry Leroux, ELDIM (France)


Published in SPIE Proceedings Vol. 5457:
Optical Metrology in Production Engineering
Wolfgang Osten; Mitsuo Takeda, Editor(s)

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