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Proceedings Paper

Analysis of grating profiles of phase holograms recorded in silver halide emulsions and processed with combinations of various developers and bleaching agents
Author(s): Istvan Banyasz
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Paper Abstract

A large number of plane-wave holograms were recorded in Agfa-Gevaert 8E75HD holographic plates, at a wide range of bias exposures and fringe visibilities. The plates were processed by various combinations of developers (AAC, Pyrogallol and Catechol) and bleaching agents (R-9 and EDTA). The phase gratings were studied by phase-contrast microscopy, using a high-power immersion (100 X) objective. The phase contrast photomicrographs were Fourier-analyzed. Thus first- second- and third-order modulation of the refractive index as a function of the bias exposure and the visibility of the recording interference pattern could be determined. The ratio of the amplitudes of the higher-order modulations to that of the first-order one can serve as a measure of the nonlinearity of the holographic recording.

Paper Details

Date Published: 1 September 2004
PDF: 13 pages
Proc. SPIE 5456, Photon Management, (1 September 2004); doi: 10.1117/12.545155
Show Author Affiliations
Istvan Banyasz, Research Institute for Solid State Physics and Optics (Hungary)


Published in SPIE Proceedings Vol. 5456:
Photon Management
Frank Wyrowski, Editor(s)

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