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Proceedings Paper

Multicomponent laser shearography for the investigation of defects in rotating machinery
Author(s): Roger M. Groves; Stephen W. James; Stuart E. Barnes; Shan Fu; Domenico Furfari; Philip E. Irving; Ralph P. Tatam
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Paper Abstract

Shearography is a full-field interferometric optical technique that is usually used for the qualitative investigation of defects in non-destructive testing applications. The optical configuration is sensitive directly to displacement gradient, a parameter closely related to the surface strain. The component of the displacement gradient that is measured is determined by the illumination and viewing directions and by the direction of the applied shear. The sensitivity is governed by the magnitude of applied shear and by the optical wavelength. Full characterisation of the surface strain requires a measurement of six-components of displacement gradient; this is achieved in shearography by forming a number of distinct measurement channels using multiple illumination, or viewing, directions. In this paper the authors discuss the quantitative measurement of the strain field around a fatigue crack, using a time-division-multiplexed diode laser shearography instrument. To investigate moving objects, a pulsed laser provides a method of freezing the object position at two points in the loading cycle. A shearography instrument incorporating two frequency doubled pulsed Nd:YAG lasers, with a common injection seeder is described. The measurement channels are spatially-multiplexed by viewing from four directions using an optical fibre imaging bundle, with optical processing at a remotely located interferometer head. Preliminary experimental measurements are presented.

Paper Details

Date Published: 10 September 2004
PDF: 11 pages
Proc. SPIE 5457, Optical Metrology in Production Engineering, (10 September 2004); doi: 10.1117/12.545125
Show Author Affiliations
Roger M. Groves, Cranfield Univ. (United Kingdom)
Stephen W. James, Cranfield Univ. (United Kingdom)
Stuart E. Barnes, Cranfield Univ. (United Kingdom)
Shan Fu, Cranfield Univ. (United Kingdom)
Domenico Furfari, Cranfield Univ. (United Kingdom)
Philip E. Irving, Cranfield Univ. (United Kingdom)
Ralph P. Tatam, Cranfield Univ. (United Kingdom)

Published in SPIE Proceedings Vol. 5457:
Optical Metrology in Production Engineering
Wolfgang Osten; Mitsuo Takeda, Editor(s)

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