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Proceedings Paper

Metrological properties of Moire topography
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Paper Abstract

Topography is a method giving a contour map as result of measurement describing three-dimensional shape of measured objects. The paper is focused to projection moire topography. The measurement model is compiled at first of all. The parameters of topography (accuracy, sensitivity, resolution, range) are introduced by virtue of this model. They are the great tool for description of measurement from the point of view of its quality. Some examples of topography of object are introduced to illustrate the theoretical principles at the end.

Paper Details

Date Published: 21 November 2003
PDF: 9 pages
Proc. SPIE 5259, 13th Polish-Czech-Slovak Conference on Wave and Quantum Aspects of Contemporary Optics, (21 November 2003); doi: 10.1117/12.545124
Show Author Affiliations
Tomas Rossler, Palacky Univ. (Czech Republic)
Miroslav Hrabovský, Palacký Univ. (Czech Republic)
Institute of Physics (Czech Republic)


Published in SPIE Proceedings Vol. 5259:
13th Polish-Czech-Slovak Conference on Wave and Quantum Aspects of Contemporary Optics
Jerzy Nowak; Marek Zajac; Jan Masajada, Editor(s)

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