Share Email Print
cover

Proceedings Paper

The use of an optically trapped microprobe for scanning details of surface
Author(s): Mojmir Sery; Petr Jakl; Jan Jezek; Alexandr Jonas; Pavel Zemanek; Miroslav Liska
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

We present two methods for surface profiles measurement using optically trapped probe in tightly focused laser beam (optical tweezers). The first method is based on a continuous contact of the probe with the surface (contact mode) and the second one employes the alternating contact (tapping mode). The probe deviations are detected by two-photon fluorescence excited by the trapping beam and emitted by the trapped dyed probe.

Paper Details

Date Published: 21 November 2003
PDF: 4 pages
Proc. SPIE 5259, 13th Polish-Czech-Slovak Conference on Wave and Quantum Aspects of Contemporary Optics, (21 November 2003); doi: 10.1117/12.545118
Show Author Affiliations
Mojmir Sery, Institute of Scientific Instruments (Czech Republic)
Brno Univ. of Technology (Czech Republic)
Petr Jakl, Institute of Scientific Instruments (Czech Republic)
Jan Jezek, Institute of Scientific Instruments (Czech Republic)
Alexandr Jonas, Institute of Scientific Instruments (Czech Republic)
Pavel Zemanek, Institute of Scientific Instruments (Czech Republic)
Miroslav Liska, Brno Univ. of Technology (Czech Republic)


Published in SPIE Proceedings Vol. 5259:
13th Polish-Czech-Slovak Conference on Wave and Quantum Aspects of Contemporary Optics
Jerzy Nowak; Marek Zajac; Jan Masajada, Editor(s)

© SPIE. Terms of Use
Back to Top