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Proceedings Paper

Three-dimensional vision using structured light applied to quality control in production line
Author(s): Louis-Severin Bieri; Jacques Jacot
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Paper Abstract

Traditional backlighting vision systems are unable to measure the height dimensions of an object. It can then be more convenient to use a 3D scanner, based for example on the projection of structured light. Despite the high potential of this technique and the growing demand of the industry for performing quality vision control, 3D measurement systems are still often considered as unusual solutions. This proceeding presents our 3D measurement laboratory setup based on the projection of structured light by means of a LCD beamer. This system is intended to be used in automated assembly line. The height information comes from a phase map obtained through temporal phase unwrapping. This phase always contain noise. Part of this noise brings a random phase error. A simple estimator of the random phase error is presented. It gives two parameters to which it is necessary to pay attention in order to predict measurement repeatability and thus to improve it. The estimator is experimentally validated on our setup.

Paper Details

Date Published: 10 September 2004
PDF: 9 pages
Proc. SPIE 5457, Optical Metrology in Production Engineering, (10 September 2004); doi: 10.1117/12.545039
Show Author Affiliations
Louis-Severin Bieri, Ecole Polytechnique Federale de Lausanne (Switzerland)
Jacques Jacot, Ecole Polytechnique Federale de Lausanne (Switzerland)


Published in SPIE Proceedings Vol. 5457:
Optical Metrology in Production Engineering
Wolfgang Osten; Mitsuo Takeda, Editor(s)

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