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Proceedings Paper

A fast high-resolution CMOS imager for nanosecond light pulse detections
Author(s): Frederic Morel; Jean-Pierre Le Normand; Chantal-Virginie Zint; Wilfried Uhring; Yann Hu; Daniel Mathiot
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Paper Abstract

Nowadays, imagers based on CMOS active pixel sensors (APS) have performances that are competitive with those based on charge-coupled devices (CCD). CMOS imagers offer advantages in on-chip functionalities, system power reduction, cost and miniaturisation. The FAst MOS Imager (FAMOSI) project consists in reproducing the streak camera functionality with a CMOS imager. In this paper, we present the second version of FAMOSI which makes up for the drawbacks of the first one. FAMOSI 2 has a new architecture of pixel which implements an electronic shutter and analogue accumulation capabilities. With this kind of pixel and the new architecture for controlling the integration, FAMOSI 2 can work in the low power repetitive synchroscan mode. The prototype has been fabricated in the AMS 0.35μm CMOS process. The chip is composed of 64 columns per 64 rows of pixels. The pixels have a size of 20μm per 20μm and a fill factor of 47%. The simulation shows that a conversion gain of 3.4μV/e- is obtained with a dynamic range of 1.2V, a time resolution of 400ps and a light pulse repetitive rate of 300kHz.

Paper Details

Date Published: 18 August 2004
PDF: 7 pages
Proc. SPIE 5451, Integrated Optics and Photonic Integrated Circuits, (18 August 2004); doi: 10.1117/12.545019
Show Author Affiliations
Frederic Morel, Lab. d'Electronique et de Physique des Systemes Instrumentaux (France)
Lab. Physique et Applications des Semi-conducteurs (France)
Jean-Pierre Le Normand, Lab. d' Electronique et de Physique des Systemes Instrumentaux (France)
Chantal-Virginie Zint, Lab. Physique et Applications des Semi-conducteurs (France)
Wilfried Uhring, Lab. Physique et Applications des Semi-conducteurs (France)
Yann Hu, Lab. d' Electronique et de Physique des Systemes Instrumentaux (France)
Daniel Mathiot, Lab. Physique et Applications des Semi-conducteurs (France)


Published in SPIE Proceedings Vol. 5451:
Integrated Optics and Photonic Integrated Circuits
Giancarlo C. Righini; Seppo Honkanen, Editor(s)

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