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Proceedings Paper

Hospital vulnerabilty analysis and applications of NDT technology
Author(s): Alphons Gonzalez
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Date Published:
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Proc. SPIE 5395, Nondestructive Detection and Measurement for Homeland Security II, ; doi: 10.1117/12.544578
Show Author Affiliations
Alphons Gonzalez, Univ. of Missouri/Rolla (United States)


Published in SPIE Proceedings Vol. 5395:
Nondestructive Detection and Measurement for Homeland Security II
Steven R. Doctor; Yoseph Bar-Cohen; A. Emin Aktan; H. Felix Wu, Editor(s)

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