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Proceedings Paper

A new calibration scheme for the three-dimensional depth-scanning fringe projection measurement method
Author(s): Jean-Marc Nivet; Thomas Schuster; Klaus Korner; Ulrich Droste; Hans J. Tiziani; Wolfgang Osten
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Paper Abstract

We present a measurement setup for the acquisition of topographic and 3-D point cloud data using the depth-scanning fringe projection technique (DSFP). We describe the signal generation, its processing using techniques known from short coherence interferometry and discuss a direct 3-D calibration method. Our measurement system delivers an absolute phase map of the scene under measurement. Calibration procedures for macroscopic measurement methods like fringe projection and / or photogrammetry consider the principal distance (that is to say the distance between the center of projection and the image plane) as a constant. This is feasible as long as no focusing and zooming are performed during measurement. Consequently the depth of the measurement volume is limited by the depth of sharpness of the imaging system. By focusing through the whole depth of the measurement volume, our system overcomes this problem, and offers a virtually unlimited measurement depth. However, we have to take the issue of focusing into consideration in order to calibrate our system. The well-known direct calibration method has been adapted to our DSFP setup in order to deal with the problem of geometrical aberrations and to provide a 3-D point cloud. It has been completed to a set of three polynomial transformations, which allow to include the depth-scanning principle in the calibration of the system.

Paper Details

Date Published: 10 September 2004
PDF: 10 pages
Proc. SPIE 5457, Optical Metrology in Production Engineering, (10 September 2004); doi: 10.1117/12.544251
Show Author Affiliations
Jean-Marc Nivet, Univ. Stuttgart (Germany)
Thomas Schuster, Univ. Stuttgart (Germany)
Klaus Korner, Univ. Stuttgart (Germany)
Ulrich Droste, Univ. Stuttgart (Germany)
Hans J. Tiziani, Univ. Stuttgart (Germany)
Wolfgang Osten, Univ. Stuttgart (Germany)

Published in SPIE Proceedings Vol. 5457:
Optical Metrology in Production Engineering
Wolfgang Osten; Mitsuo Takeda, Editor(s)

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