Share Email Print

Proceedings Paper

Near-field optical measurements using rare-earth-doped glass-ceramic particles
Author(s): Lionel Aigouy; Michel Mortier; Yannick De Wilde; Jacques Gierak; Eric Bourhis
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

We have developed a local optical probe that uses a sub-wavelength rare-earth-doped glass-ceramic particle as a nanodetector of electromagnetic fields. These particles have the advantage of operating at room temperature with a very good photostability. Fluorescence emission occurs at several wavelengths and we detect the intense one located around 550 nm. The fluorescence responds non-linearly to the excitation. This induces a better sensitivity to strong optical fields, so to localized evanescent fields. We will first describe the probe fabrication procedure. This step is performed with a nanomanipulator which allows the deposition of an adhesive polymer at the extremity of an atomic force microscope tip and then the sticking of the particle at the end of the tip. A reduction of the particle size with a Focused Ion Beam (FIB) is also accomplished. We will then describe some experiments performed on various test samples which demonstrate a subwavelength optical resolution. In particular, the distribution of the electromagnetic field located around nano-holes (diameter 250 nm) in metal films has been imaged.

Paper Details

Date Published: 17 August 2004
PDF: 8 pages
Proc. SPIE 5458, Optical Micro- and Nanometrology in Manufacturing Technology, (17 August 2004); doi: 10.1117/12.544106
Show Author Affiliations
Lionel Aigouy, Ecole Superieure de Physique et de Chimie Industrielles, CNRS (France)
Michel Mortier, Ecole Nationale Superieure de Chimie de Paris (France)
Yannick De Wilde, Ecole Superieure de Physique et de Chimie Industrielles (France)
Jacques Gierak, LPN, CNRS (France)
Eric Bourhis, LPN, CNRS (France)

Published in SPIE Proceedings Vol. 5458:
Optical Micro- and Nanometrology in Manufacturing Technology
Christophe Gorecki; Anand K. Asundi, Editor(s)

© SPIE. Terms of Use
Back to Top