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Proceedings Paper

Holographic interferometry deformations metrology by using AR modeling
Author(s): Rabah Mokdad; Idriss El-Hafidi; Patrick Meyrueis
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Paper Abstract

The frequency of the holographic fringe signal is proportional to the measured object deformation or displacement. Fast Fourier transform (FFT) is the most commoly used signal processing technique for analyzing output fringes. One problem with this approach is that a long data acquisition is required to achieve adequate deformation resolution, typically 5 to 10 fringes are needed. We propose using an autoregressive (AR) model to obtain with the same advantages deformation of an opaque object using holographic interferometry. This deformation will be estimated directly from the model parameters. The theoretical and experimental results obtained indicate that the proposed method has a good accuracy by using a small number of fringes.

Paper Details

Date Published: 17 August 2004
PDF: 5 pages
Proc. SPIE 5458, Optical Micro- and Nanometrology in Manufacturing Technology, (17 August 2004); doi: 10.1117/12.544098
Show Author Affiliations
Rabah Mokdad, Univ. Louis Pasteur (France)
Idriss El-Hafidi, Univ. Louis Pasteur (France)
Patrick Meyrueis, Univ. Louis Pasteur (France)

Published in SPIE Proceedings Vol. 5458:
Optical Micro- and Nanometrology in Manufacturing Technology
Christophe Gorecki; Anand K. Asundi, Editor(s)

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