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Proceedings Paper

Characterization of phase artifacts for focal plane arrays
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Paper Abstract

The spatial resolution of Focal Plane Arrays (FPA) is affected by sampling. The artifacts introduced by the sampling procedure are usually referred as "aliasing". Phase artifacts are introduced by the non-isoplanatic nature of the sampling mechanism in FPA. In this paper we introduce a stochastic description of these artifacts. This approach allows us to elucidate similarities and differences between "aliasing" and "phase effects". Figures of merit are introduced in order to characterize regions of isoplanatism in the Fourier Space. The relation between these figures of merit and target perception models is explored in order to clarify further research.

Paper Details

Date Published: 5 August 2004
PDF: 10 pages
Proc. SPIE 5407, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XV, (5 August 2004); doi: 10.1117/12.543981
Show Author Affiliations
Jose Manuel Lopez-Alonso, Univ. Complutense de Madrid (Spain)
Javier Alda, Univ. Complutense de Madrid (Spain)

Published in SPIE Proceedings Vol. 5407:
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XV
Gerald C. Holst, Editor(s)

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