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Proceedings Paper

Spatial characterization of light detectors with nanometric resolution
Author(s): Javier Alda; Jose Manuel Lopez-Alonso; Jose Maria Rico-Garcia; Jesus Zoido; Glenn Boreman
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Paper Abstract

The miniaturization of light detectors in the visible and infrared has produced devices with micrometric and sub-micrometric spatial features. Some of these spatial features are closely linked with the physical mechanism of detection. An example of these devices is an optical antennas. To spatially characterize optical antennas it is necessary to scan a probe beam on the plane of the optical antenna. The mapping of this response is then treated and analyzed. When the response of the antenna is monitorized at visible or near-infrared frequencies, a sub-micron scanning step is necessary. In this paper we show the experimental set-up of a measurement station having a spatial resolution of 50 nanometers. This station is devoted to spatially characterize micrometric detectors, and specially optical antennas. The origin of the uncertainties of the measurement protocol is shown and practically analyzed. This station is also applied for characterizing the temporal, spectral, and polarization sensitivity specifications of light detectors with the previously mentioned resolution.

Paper Details

Date Published: 5 August 2004
PDF: 10 pages
Proc. SPIE 5407, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XV, (5 August 2004); doi: 10.1117/12.543979
Show Author Affiliations
Javier Alda, Univ. Complutense de Madrid (Spain)
Jose Manuel Lopez-Alonso, Univ. Complutense de Madrid (Spain)
Jose Maria Rico-Garcia, Univ. Complutense de Madrid (Spain)
Jesus Zoido, Univ. Complutense de Madrid (Spain)
Glenn Boreman, College of Optics and Photonics/Univ. of Central Florida (United States)


Published in SPIE Proceedings Vol. 5407:
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XV
Gerald C. Holst, Editor(s)

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