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Proceedings Paper

Design and implementation of a real-time positron imager
Author(s): Pranab Sabitru Naik; Christopher David Beling; Stevenson Fung
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Paper Abstract

In this paper we are going to present the first real-time S-parameter positron imager. This is a useful tool in solid state technology for mapping the lateral defect types and concentrations on a material sample. This technology has been developed for two major categories of researchers, the first being those that have a focused low energy positron beam and second those that do not. Here we describe the design and implementation of a real-time automated scanning system that rasters a sample surface with a 0.5mm diameter positron source (or beam focus) so as to give an S-parameter image of a sample. The source (or beam) rasters across a region of a semiconductor sample in rectilinear motion while gamma ray energies Eγ are processed using a standard HP Ge spectroscopy system and a 14 bit nuclear ADC. Two other ADCs are used to obtain the x, y coordinate data corresponding to each event by storing voltage pulses from the x & y stepper motor drives (or saddle coil currents) gated with the event pulses. Using these event data triplets (x, y, Eγ) the S-parameter is computed in real time for each pixel region and is used to refresh a color image display on the screen coordinates. Optimal use is made of processing time and the system resources. This user-friendly system is efficient for producing high resolution S-parameter images of the sample. (patent pending 2003)

Paper Details

Date Published: 18 May 2004
PDF: 5 pages
Proc. SPIE 5297, Real-Time Imaging VIII, (18 May 2004); doi: 10.1117/12.543925
Show Author Affiliations
Pranab Sabitru Naik, Univ. of Hong Kong (Hong Kong)
Christopher David Beling, Univ. of Hong Kong (Hong Kong)
Stevenson Fung, Univ. of Hong Kong (Hong Kong)

Published in SPIE Proceedings Vol. 5297:
Real-Time Imaging VIII
Nasser Kehtarnavaz; Phillip A. Laplante, Editor(s)

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