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Proceedings Paper

Measurement of non-Gaussian shot noise: influence of the environment
Author(s): Bertrand Marie Reulet; Lafe Spietz; Christopher Mogan Wilson; Julien Senzier; Daniel Ethan Prober
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Paper Abstract

We present the first measurements of the third moment of the voltage fluctuations in a conductor. This technique can provide new and complementary information on the electronic transport in conducting systems. The measurement was performed on non-superconducting tunnel junctions as a function of voltage bias, for various temperatures and bandwidths up to 1GHz. The data demonstrate the significant effect of the electromagnetic environment of the sample.

Paper Details

Date Published: 25 May 2004
PDF: 13 pages
Proc. SPIE 5469, Fluctuations and Noise in Materials, (25 May 2004); doi: 10.1117/12.543529
Show Author Affiliations
Bertrand Marie Reulet, Yale Univ. (United States)
Universite Paris-Sud (France)
Lafe Spietz, Yale Univ. (United States)
Christopher Mogan Wilson, Yale Univ. (United States)
Julien Senzier, Yale Univ. (United States)
Daniel Ethan Prober, Yale Univ. (United States)


Published in SPIE Proceedings Vol. 5469:
Fluctuations and Noise in Materials
Dragana Popovic; Michael B. Weissman; Zoltan A. Racz, Editor(s)

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