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Proceedings Paper

Hemispherical scatter instrument for reflectance function measurement based on the discrete-ordinates method
Author(s): Mauricio A. Sanchez; William H. Sutton; Carlos P. Borras
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Paper Abstract

We present a new portable infrared-based hemispherical scatterometer to rapidly and accurately determine out of plane reflectance function (BRDF) of homogeneous surfaces. The position of the 12 detectors has been selected based on angular distribution scheme of the S4 quadrature of the discrete-ordinates method. The reflectance data obtained from this device can be directly applied to radiation transport schemes for problems involving highly accurate surface characterization. With this instrument infrared energy scattering can be performed in multiple directions and sequences at the same time. With measurements for a variety of fire barrier materials used in non-bearing walls we demonstrated the usefulness of this apparatus over a limited range of scattering directions. Verification of the measurements is done by comparing theoretical and experimental data of radiative intensity distribution in fire blanket insulation when impinged by a collimated flux and using an opaque reflector with arbitrary properties but previously determined reflectance function as a radiative boundary. The same equipment can be used to measure other radiative properties for different materials and it has been envisioned as a portable tool for rapid property and surface defects estimation in manufacturing processes.

Paper Details

Date Published: 5 August 2004
PDF: 10 pages
Proc. SPIE 5431, Targets and Backgrounds X: Characterization and Representation, (5 August 2004); doi: 10.1117/12.543475
Show Author Affiliations
Mauricio A. Sanchez, Oklahoma City Community College (United States)
William H. Sutton, Univ. of Alabama (United States)
Carlos P. Borras, Univ. of Oklahoma (United States)


Published in SPIE Proceedings Vol. 5431:
Targets and Backgrounds X: Characterization and Representation
Wendell R. Watkins; Dieter Clement; William R. Reynolds, Editor(s)

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