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Proceedings Paper

Combined calibration and nonuniformity correction of a sensor for improved projector nonuniformity correction
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Paper Abstract

One proven technique for nonuniformity correction (NUC) of a resistor array infrared scene projector requires careful measurement of the output-versus-input response for every emitter in a large array. In previous papers, we have discussed methods and results for accomplishing the projector NUC. Two difficulties that may limit the NUC results are residual nonuniformity in the calibration sensor, and nonlinearity in the calibration sensor's response to scene radiance. These effects introduce errors in the measurement of the projector elements' output, which lead to residual nonuniformity. In this paper we describe a recent effort to mitigate both of these problems using a procedure that combines sensor nonuniformity correction and sensor calibration, detector by detector, so that these problems do not contaminate the projector NUC. By measuring a set of blackbody flood-field images at a dozen or so different temperatures, the individual detector output-versus-input radiance responses can be measured. Similar to the projector NUC, we use a curve-fitting routine to model the response of each detector. Using this set of response curves, a post-processing algorithm is used to correct and calibrate the images measured by the sensor. We have used this approach to reduce several sensor error sources by a factor of 10 to 100. The resulting processing is used to correct and calibrate all of the sensor images used to perform the projector NUC, as one step in the projector NUC. The procedure appears to be useful for any application where sensor nonuniformity or response nonlinearities are significant.

Paper Details

Date Published: 4 August 2004
PDF: 10 pages
Proc. SPIE 5408, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing IX, (4 August 2004); doi: 10.1117/12.543063
Show Author Affiliations
Breck A. Sieglinger, MacAulay Brown Inc. (United States)
David S. Flynn, MacAulay Brown Inc. (United States)
R. Bryan Sisko, Aegis Technologies Group, Inc. (United States)
George C. Goldsmith, Air Force Research Lab. (United States)
Rhoe A. Thompson, Air Force Research Lab. (United States)
William M. Meshell, MacAulay Brown Inc. (United States)
James D. Norman, Air Force Research Lab. (United States)

Published in SPIE Proceedings Vol. 5408:
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing IX
Robert Lee Murrer, Editor(s)

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