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Proceedings Paper

Synthesis and characterization of high-energy nanoparticles
Author(s): Perla M. Torres; Lewis Mortimer Gomez; Samuel P. Hernandez-Rivera; Richard T. Lareau; R. Thomas Chamberlain; Miguel E. Castro-Rosario
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Paper Abstract

Atomic force microscopy (AFM), scanning electron microscopy (SEM), white light imaging measurements, and Raman microscopy were employed for the characterization of RDX nanoparticles deposited on glass substrate surfaces. The RDX nanoparticles were prepared by exposure of glass substrate surfaces to an aerosol jet containing RDX. The spectroscopic signature of RDX particles and the two known forms of the material, β and α RDX, are compared. Raman measurements reveal that RDX nanoparticles and β deposits have similar spectroscopic signatures between 750 and 1000 cm-1.

Paper Details

Date Published: 15 September 2004
PDF: 9 pages
Proc. SPIE 5403, Sensors, and Command, Control, Communications, and Intelligence (C3I) Technologies for Homeland Security and Homeland Defense III, (15 September 2004); doi: 10.1117/12.542859
Show Author Affiliations
Perla M. Torres, Univ. de Puerto Rico/Mayaguez (United States)
Lewis Mortimer Gomez, Univ. de Puerto Rico/Mayaguez (United States)
Samuel P. Hernandez-Rivera, Univ. de Puerto Rico/Mayaguez (United States)
Richard T. Lareau, Transportation Security Administration (United States)
R. Thomas Chamberlain, Transportation Security Administration (United States)
Miguel E. Castro-Rosario, Univ. de Puerto Rico/Mayaguez (United States)


Published in SPIE Proceedings Vol. 5403:
Sensors, and Command, Control, Communications, and Intelligence (C3I) Technologies for Homeland Security and Homeland Defense III
Edward M. Carapezza, Editor(s)

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