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Proceedings Paper

Two-color HgCdTe focal plane detector simulation
Author(s): Thomas J. Sanders; Glenn T. Hess; Scott Eisert
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Paper Abstract

This paper describes a simulation technology for HgCdTe infrared detectors used in advanced IR focal plane array architectures. This model addresses the material processes needed for fabrication and the electrical characteristics of multi-layer structures covering a wide range of wavelengths from middle wavelength to very long wavelength.

Paper Details

Date Published: 5 August 2004
PDF: 8 pages
Proc. SPIE 5407, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XV, (5 August 2004); doi: 10.1117/12.542342
Show Author Affiliations
Thomas J. Sanders, Advanced Engineering Technology, Inc. (United States)
Glenn T. Hess, Advanced Engineering Technology, Inc. (United States)
Scott Eisert, Advanced Engineering Technology, Inc. (United States)


Published in SPIE Proceedings Vol. 5407:
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XV
Gerald C. Holst, Editor(s)

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