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Proceedings Paper

NDE of microstructured materials by x-ray diffraction and refraction topography
Author(s): Manfred P. Hentschel; Axel Lange; K.-Wolfram Harbich; Joerg Schors; Oliver Wald; Bernd R. Mueller
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Paper Abstract

For the purpose of micro structural characterization X-ray topography reveals the spatially resolved scattering of materials and small components. It combines the advantages of radiographic imaging and the analytical information of wide and small angle X-ray scattering like phase distribution, texture, micro cracks, interfaces and pores. Scanning techniques at selected scattering conditions permit the topographic characterization of any crystalline or amorphous solid or liquid. Topographic methods and applications for the purposes of research, quality control and damage evaluation are presented.

Paper Details

Date Published: 21 July 2004
PDF: 8 pages
Proc. SPIE 5392, Testing, Reliability, and Application of Micro- and Nano-Material Systems II, (21 July 2004); doi: 10.1117/12.541532
Show Author Affiliations
Manfred P. Hentschel, Bundesanstalt fur Materialforschung und -pruefung (Germany)
Axel Lange, Bundesanstalt fur Materialforschung und -pruefung (Germany)
K.-Wolfram Harbich, Bundesanstalt fur Materialforschung und -pruefung (Germany)
Joerg Schors, Bundesanstalt fur Materialforschung und -pruefung (Germany)
Oliver Wald, Bundesanstalt fur Materialforschung und -pruefung (Germany)
Bernd R. Mueller, Bundesanstalt fur Materialforschung und -pruefung (Germany)


Published in SPIE Proceedings Vol. 5392:
Testing, Reliability, and Application of Micro- and Nano-Material Systems II
Norbert Meyendorf; George Y. Baaklini; Bernd Michel, Editor(s)

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