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Proceedings Paper

Benefits of microscan for staring infrared imagers
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Paper Abstract

Imagers based on focal plane arrays (FPA) risk introducing in-band and out-of-band spurious response, or aliasing, due to undersampling. This can make high-level discrimination tasks such as recognition and identification much more difficult. To overcome this problem, three-chip color charge coupled device (CCD) cameras typically offset one CCD by 1/2 pixel with respect to the other two. Analogously, monochrome imagers including infrared can use microscan (or dither) to reduce aliasing. This paper describes a generic microscan technique and benefits of microscanning. Covered are analysis and experiments on four-point microscan employed in infrared imagers, in which the image is mechanically shifted by 1/2 pixel between fields, in each dimension. Four of these offset fields are then combined to form one frame of high-resolution video. We show that microscan reduces aliasing, which results in higher resolution and improved image quality resulting in improved performance.

Paper Details

Date Published: 5 August 2004
PDF: 12 pages
Proc. SPIE 5407, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XV, (5 August 2004); doi: 10.1117/12.541432
Show Author Affiliations
John Lester Miller, FLIR Systems, Inc. (United States)
John M. Wiltse, FLIR Systems, Inc. (United States)

Published in SPIE Proceedings Vol. 5407:
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XV
Gerald C. Holst, Editor(s)

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