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Proceedings Paper

PVD fault detection using disparate integrated data sources
Author(s): Alan F. Krauss
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Paper Abstract

In this paper, sensor data pertaining to plasma sputtering is examined. A sensor system monitoring power supply signals and detecting arcs was integrated with manufacturing equipment and data collected. In-situ measurements from the sensors correlate with post-process yield metrology, providing a mechanism for improved process control. Furthermore, from the rich set of data streaming from the sensors various classes of faults can be diagnosed. An error calculation and variable transformation methodology is presented so that classes of faults may be discriminated from one another.

Paper Details

Date Published: 29 April 2004
PDF: 9 pages
Proc. SPIE 5378, Data Analysis and Modeling for Process Control, (29 April 2004); doi: 10.1117/12.540790
Show Author Affiliations
Alan F. Krauss, Schneider Electric (United States)


Published in SPIE Proceedings Vol. 5378:
Data Analysis and Modeling for Process Control
Kenneth W. Tobin, Editor(s)

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