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Proceedings Paper

Terahertz wave imaging for landmine detection
Author(s): Hua Zhong; Nick Karpowicz; Jason Partridge; Xu Xie; Jingzhou Xu; Xi-Cheng Zhang
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Paper Abstract

Pulsed THz imaging is a promising non-destructive technology based on its high transmission through selected dielectric materials and its capability to provide time-of-flight and spectral information. The traditional method of the pulsed THz imaging is a point-to-point reflective scanning system. The image is acquired by analyzing the peak amplitude information of the THz pulse in the time-domain at each pixel. It requires the THz beam or sample scanned. In this paper, we present our approach of large scale, focal plane THz wave imaging. In our 2-D focal plane THz wave imaging, the THz beam is expanded to be 60 mm in diameter. The THz beam illuminates the target in a reflective manner, in which a polyethylene lens projects the image onto a 40 mm by 40 mm by 2 mm ZnTe sensor crystal. The probe beam is expanded to be 40 mm in diameter and overlap with the THz beam on the sensor. The modulated probe beam profile carrying the image information is captured by a CCD camera. This technique enables us to view the objects which are optically opaque but transparent in THz frequency and shows feasibility in remote sensing, security inspection, and military defense applications.

Paper Details

Date Published: 8 September 2004
PDF: 12 pages
Proc. SPIE 5411, Terahertz for Military and Security Applications II, (8 September 2004); doi: 10.1117/12.540502
Show Author Affiliations
Hua Zhong, Rensselaer Polytechnic Institute (United States)
Nick Karpowicz, Rensselaer Polytechnic Institute (United States)
Jason Partridge, Rensselaer Polytechnic Institute (United States)
Xu Xie, Rensselaer Polytechnic Institute (United States)
Jingzhou Xu, Rensselaer Polytechnic Institute (United States)
Xi-Cheng Zhang, Rensselaer Polytechnic Institute (United States)


Published in SPIE Proceedings Vol. 5411:
Terahertz for Military and Security Applications II
R. Jennifer Hwu; Dwight L. Woolard, Editor(s)

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