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Proceedings Paper

Preliminary research in using the technology of data mining to analyze remote sensing data
Author(s): Xiongfei Zhang; Xing Li; Xia Zhang; Qingxi Tong; Wei Liu; Lanfen Zheng
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Paper Abstract

Remote sensing data, especially the hyperspectral remote sensing data, characterize their great quantities. So how to deal wtih these data is a focus. Database has solved the problem of storing, searching, updating and maintaining of the data, but it is not satisfactory in disposing them. In recent years, the technology of data warehouse has great development. It can re-integrate, synthesize and separate the data of database, and use the searching pattern of multiple dimensions to realize data mining (DM). This technolgoy has been widely used in commerce to analyze the inner relationship of the numerous data and makes some remarkable achievements in decision supporting. Data warehouse and Data mining technology have been used in GIS. This article would give a set of complete steps and some general methods in using the DM to analyze the remote sensing data, especially in hyperspectral data. And it tries to do some preliminary exploration in using it to deeply analyze the potential relations among the acquired spectra, images and biology parameters of the experiments and get some anticipated possible results.

Paper Details

Date Published: 25 September 2003
PDF: 6 pages
Proc. SPIE 5286, Third International Symposium on Multispectral Image Processing and Pattern Recognition, (25 September 2003); doi: 10.1117/12.539951
Show Author Affiliations
Xiongfei Zhang, Institute of Remote Sensing Applications, CAS (China)
Xing Li, Institute of Remote Sensing Applications, CAS (China)
Xia Zhang, Institute of Remote Sensing Applications, CAS (China)
Qingxi Tong, Institute of Remote Sensing Applications, CAS (China)
Wei Liu, Tsinghua Univ. (China)
Lanfen Zheng, Institute of Remote Sensing Applications, CAS (China)


Published in SPIE Proceedings Vol. 5286:
Third International Symposium on Multispectral Image Processing and Pattern Recognition
Hanqing Lu; Tianxu Zhang, Editor(s)

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