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Proceedings Paper

Self-assembled nanostructured sensors
Author(s): J. H. Lalli; A. Hill; S. Hannah; S. Subrahmanyan; M. Bortner; J. Mecham; B. Davis; R. Goff; Richard O. Claus
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Paper Abstract

We report the development of nanostructured strain sensors formed by electrostatic self-assembly (ESA) processing. The sensors may be used to measure strains from 1 microstrain to more than 100% strain, over gauge lengths ranging from approximately 1 millimeter to tens of centimeters.

Paper Details

Date Published: 27 July 2004
PDF: 5 pages
Proc. SPIE 5384, Smart Structures and Materials 2004: Smart Sensor Technology and Measurement Systems, (27 July 2004); doi: 10.1117/12.539843
Show Author Affiliations
J. H. Lalli, NanoSonic, Inc. (United States)
A. Hill, NanoSonic, Inc. (United States)
S. Hannah, NanoSonic, Inc. (United States)
S. Subrahmanyan, NanoSonic, Inc. (United States)
M. Bortner, NanoSonic, Inc. (United States)
J. Mecham, NanoSonic, Inc. (United States)
B. Davis, NanoSonic, Inc. (United States)
R. Goff, NanoSonic, Inc. (United States)
Virginia Polytechnic Institute and State Univ. (United States)
Richard O. Claus, NanoSonic, Inc. (United States)
Virginia Polytechnic Institute and State Univ. (United States)


Published in SPIE Proceedings Vol. 5384:
Smart Structures and Materials 2004: Smart Sensor Technology and Measurement Systems
Eric Udd; Daniele Inaudi, Editor(s)

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