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Proceedings Paper

Automatic assessment and reduction of noise using edge pattern analysis in non-linear image enhancement
Author(s): Daniel J. Jobson; Zia-ur Rahman; Glenn A. Woodell; Glenn D. Hines
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Paper Abstract

Noise is the primary visibility limit in the process of non-linear image enhancement, and is no longer a statistically stable additive noise in the post-enhancement image. Therefore novel approaches are needed to both assess and reduce spatially variable noise at this stage in overall image processing. Here we will examine the use of edge pattern analysis both for automatic assessment of spatially variable noise and as a foundation for new noise reduction methods.

Paper Details

Date Published: 15 July 2004
PDF: 9 pages
Proc. SPIE 5438, Visual Information Processing XIII, (15 July 2004); doi: 10.1117/12.539786
Show Author Affiliations
Daniel J. Jobson, NASA Langley Research Ctr. (United States)
Zia-ur Rahman, College of William and Mary (United States)
Glenn A. Woodell, NASA Langley Research Ctr. (United States)
Glenn D. Hines, NASA Langley Research Ctr. (United States)


Published in SPIE Proceedings Vol. 5438:
Visual Information Processing XIII
Zia-ur Rahman; Robert A. Schowengerdt; Stephen E. Reichenbach, Editor(s)

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