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Proceedings Paper

Reliability of oxide VCSELs at Emcore
Author(s): Christopher J. Helms; Ian Aeby; Wenlin Luo; Robert W Herrick; Albert Yuen
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Paper Abstract

Recent data on 10 Gb/s oxide VCSELs are presented. We cover failure analysis results on VCSELs that failed in the field, including failures due to electrostatic discharge (ESD) and those inherent to the limitations of the present mesa structure used in oxide VCSELs. An ongoing experiment to overcome these limitations is discussed.

Paper Details

Date Published: 16 June 2004
PDF: 7 pages
Proc. SPIE 5364, Vertical-Cavity Surface-Emitting Lasers VIII, (16 June 2004); doi: 10.1117/12.539282
Show Author Affiliations
Christopher J. Helms, EMCORE Corp. (United States)
Ian Aeby, EMCORE Corp. (United States)
Wenlin Luo, EMCORE Corp. (United States)
Robert W Herrick, EMCORE Corp. (United States)
Albert Yuen, EMCORE Corp. (United States)


Published in SPIE Proceedings Vol. 5364:
Vertical-Cavity Surface-Emitting Lasers VIII
Chun Lei; Kent D. Choquette; Sean P. Kilcoyne, Editor(s)

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