Share Email Print

Proceedings Paper

Methods and piezoelectric imbedded sensors for damage detection in composite plates under ambient and cryogenic conditions
Author(s): Robert C. Engberg; Teng K. Ooi
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

New methods for structural health monitoring are being assessed, especially in high-performance, extreme environment, safety-critical applications. One such application is for composite cryogenic fuel tanks. The work presented here attempts to characterize and investigate the feasibility of using imbedded piezoelectric sensors to detect cracks and delaminations under cryogenic and ambient conditions. A variety of damage detection methods and different sensors are employed in the different composite plate samples to aid in determining an optimal algorithm, sensor placement strategy, and type of imbedded sensor to use. Variations of frequency, impedance measurements, and pulse echoing techniques of the sensors are employed and compared. Statistical and analytic techniques are then used to determine which method is most desirable for a specific type of damage. These results are furthermore compared with previous work using externally mounted sensors. Results and optimized methods from this work can then be incorporated into a larger composite structure to validate and assess its structural health. This could prove to be important in the development and qualification of any 2nd generation reusable launch vehicle using composites as a structural element.

Paper Details

Date Published: 27 July 2004
PDF: 9 pages
Proc. SPIE 5384, Smart Structures and Materials 2004: Smart Sensor Technology and Measurement Systems, (27 July 2004); doi: 10.1117/12.539276
Show Author Affiliations
Robert C. Engberg, NASA Marshall Space Flight Ctr. (United States)
Teng K. Ooi, Univ. of Alabama in Huntsville (United States)

Published in SPIE Proceedings Vol. 5384:
Smart Structures and Materials 2004: Smart Sensor Technology and Measurement Systems
Eric Udd; Daniele Inaudi, Editor(s)

© SPIE. Terms of Use
Back to Top