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Proceedings Paper

A novel method for internal feature reconstruction based on infrared thickness measurement
Author(s): Zhongguo Li; Kelvin Wang; Chunhe Gong; Kevin G. Harding
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Paper Abstract

This paper presents a novel method to reconstruct the internal structures of a mechanical part based on 2D thickness measurement from an Infrared (IR) measurement system. Conventionally, the internal structures are measured by X-Ray imaging techniques but those methods suffer from large measurement errors (higher than 0.125 mm). Using an innovative fixture, this new method first registers the 2D thickness measurement data with a 3D CAD model or a 3D point cloud representing the external feature of the measured part, and then reconstructs the internal features based on the thickness information from IR system. Experimental results shows this new method provides significantly high accuracy compared with X-Ray imaging techniques.

Paper Details

Date Published: 25 September 2003
PDF: 8 pages
Proc. SPIE 5286, Third International Symposium on Multispectral Image Processing and Pattern Recognition, (25 September 2003); doi: 10.1117/12.539270
Show Author Affiliations
Zhongguo Li, GE Global Research Ctr. (China)
Kelvin Wang, GE Global Research Ctr. (China)
Chunhe Gong, GE Global Research Ctr. (United States)
Kevin G. Harding, GE Global Research Ctr. (United States)


Published in SPIE Proceedings Vol. 5286:
Third International Symposium on Multispectral Image Processing and Pattern Recognition
Hanqing Lu; Tianxu Zhang, Editor(s)

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