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Proceedings Paper

Applications of discrete multiwavelet techniques to image denoising
Author(s): Haihui Wang; Jiaxiong Peng; Wei Wu; Bin Ye
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Paper Abstract

In this paper, we present a new method by using 2-D discrete multiwavelet transform in image denoising. The developments in wavelet theory have given rise to the wavelet thresholding method, for extracting a signal from noisy data. The method of signal denoising via wavelet thresholding was popularized. Multiwavelets have recently been introduced and they offer simultaneous orthogonality, symmetry and short support. This property makes multiwavelets more suitable for various image processing applications, especially denoising. It is based on thresholding of multiwavelet coefficients arising from the standard scalar orthogonal wavelet transform. It takes into account the covariance structure of the transform. Denoising is images via thresholding of the multiwavelet coefficients result from preprocessing and the discrete multiwavelet transform can be carried out by threating the output in this paper. The form of the threshold is carefully formulated and is the key to the excellent results obtained in the extensive numerical simulations of image denoising. The performances of multiwavelets are compared with those of scalar wavelets. Simulations reveal that multiwavelet based image denoising schemes outperform wavelet based method both subjectively and objectively.

Paper Details

Date Published: 25 September 2003
PDF: 4 pages
Proc. SPIE 5286, Third International Symposium on Multispectral Image Processing and Pattern Recognition, (25 September 2003); doi: 10.1117/12.538673
Show Author Affiliations
Haihui Wang, Huazhong Univ. of Science and Technology (China)
Jiaxiong Peng, Huazhong Univ. of Science and Technology (China)
Wei Wu, Huazhong Univ. of Science and Technology (China)
Bin Ye, Huazhong Univ. of Science and Technology (China)


Published in SPIE Proceedings Vol. 5286:
Third International Symposium on Multispectral Image Processing and Pattern Recognition
Hanqing Lu; Tianxu Zhang, Editor(s)

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