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Proceedings Paper

Characterization results of 1k x 1k charge-multiplying CCD image sensor
Author(s): Sachihiko Ohta; Hiroaki Shibuya; Izumi Kobayashi; Toshio Tachibana; Takahiro Nishiwaki; Jaroslav Hynecek
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Paper Abstract

The paper describes several important characterization results obtained from the recently developed high performance front side illuminated 1k x 1k Frame Transfer CCD image sensor that employs charge multiplication concept to multiply photo generated charge directly in charge domain before its conversion into a voltage. The description includes the key device design features that were instrumental in obtaining the high performance and then focuses on the key characterization parameters such as excess noise and carrier distribution of the charge multiplication process. The remaining focus of the article is on the characterization methodology and on the obtained results such as the high clocking frequency (35 MHz), low serial register clock voltage operation, high sensitivity at low light levels, high QE, high blue response, no image lag, overload performance of lateral anti blooming drain structure, etc. In conclusion, several imaging comparisons between the conventional state of the art CCD image sensor and the developed charge-multiplying image sensor are also shown.

Paper Details

Date Published: 7 June 2004
PDF: 10 pages
Proc. SPIE 5301, Sensors and Camera Systems for Scientific, Industrial, and Digital Photography Applications V, (7 June 2004); doi: 10.1117/12.538631
Show Author Affiliations
Sachihiko Ohta, Texas Instruments Japan Ltd. (Japan)
Hiroaki Shibuya, Texas Instruments Japan Ltd. (Japan)
Izumi Kobayashi, Texas Instruments Japan Ltd. (Japan)
Toshio Tachibana, Texas Instruments Japan Ltd. (Japan)
Takahiro Nishiwaki, Texas Instruments Japan Ltd. (Japan)
Jaroslav Hynecek, Isetex, Inc. (United States)


Published in SPIE Proceedings Vol. 5301:
Sensors and Camera Systems for Scientific, Industrial, and Digital Photography Applications V
Nitin Sampat; Morley M. Blouke; Ricardo J. Motta, Editor(s)

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