Share Email Print

Proceedings Paper

A study on the extraction of DEM from a single SAR image
Author(s): Jie Yang; DenRen Li
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

SAR is a side-looking imaging mode and its image is very sensitive to the terrain shape. The little undulation of the terrain may induce the change of the image gray distribution and/or the texture characteristics. In this paper, the radarclinometry for extracting ditital elevation from single SAR image is investigated, which is based on the shape-from-shading principle developed in computer vision, consists in estimating the geometric parameters of a ground, from its radiometry and more precisely from the backscattered intensity coming from a piece of imaged ground. Firstly, the approaches for generation of the digital elevation from the SAR image data are discussed. Secondly the method of radarclinometry will be briefly described. The elevation reconstruction relies on the Lambertiam assumption for the terrain backscatter model. Then a single-line integral process is applied to calculate each pixel altitude, but it is still contaminated by noise. Finally the multi-line integral processing with various directions and the simulated annealing algorithm are respectibvely introduced to improve the single-line integral processing result. The presented experiment results promising in many geographic applications. This is an interesting technique of relief restoring, because it uses one single image only.

Paper Details

Date Published: 25 September 2003
PDF: 4 pages
Proc. SPIE 5286, Third International Symposium on Multispectral Image Processing and Pattern Recognition, (25 September 2003); doi: 10.1117/12.538558
Show Author Affiliations
Jie Yang, Wuhan Univ. (China)
DenRen Li, Wuhan Univ. (China)

Published in SPIE Proceedings Vol. 5286:
Third International Symposium on Multispectral Image Processing and Pattern Recognition
Hanqing Lu; Tianxu Zhang, Editor(s)

© SPIE. Terms of Use
Back to Top