Share Email Print
cover

Proceedings Paper

Characterization techniques for second-order nonlinear optical materials
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

A review of measurement techniques and nonlinear coefficient values are presented. Coefficients of a few materials are evolving as standards by consensus based on independent measurements. Improved instrumentation, extension of measurement techniques, and more detailed analysis are improving accuracy in recent measurements. Confusion still remains for values of some materials, and specification of the reporting frame for the tensor values remains an issue.

Paper Details

Date Published: 14 June 2004
PDF: 10 pages
Proc. SPIE 5337, Nonlinear Frequency Generation and Conversion: Materials, Devices, and Applications III, (14 June 2004); doi: 10.1117/12.538492
Show Author Affiliations
Robert C. Eckardt, Cleveland Crystals, Inc. (United States)
Gary C. Cattela, Cleveland Crystals, Inc. (United States)


Published in SPIE Proceedings Vol. 5337:
Nonlinear Frequency Generation and Conversion: Materials, Devices, and Applications III
Kenneth L. Schepler; Dennis D. Lowenthal, Editor(s)

© SPIE. Terms of Use
Back to Top