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Proceedings Paper

Femtosecond x-ray diagnostic
Author(s): Davide Boschetto; Christian Rischel; Olivier Albert; Jean Etchepare; Ingo Uschmann; S. Fourmaux; Daniele Hulin; Eckhart Forster; Antoine Rousse
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Paper Abstract

In this paper we discuss some result achieved at Laboratoire d'Optique Appliquee that may improve the capabilities of the laser-produced plasma x-ray source for applications in the study of ultrafast transient structures.

Paper Details

Date Published: 14 November 2003
PDF: 6 pages
Proc. SPIE 5147, ALT'02 International Conference on Advanced Laser Technologies, (14 November 2003); doi: 10.1117/12.537507
Show Author Affiliations
Davide Boschetto, Ecole Nationale Superieure de Techniques Avancees (France)
Christian Rischel, Niels Bohr Institute (Denmark)
Olivier Albert, Ecole Nationale Superieure de Techniques Avancees (France)
Jean Etchepare, Ecole Nationale Superieure de Techniques Avancees (France)
Ingo Uschmann, Friedrich-Schiller-Univ. Jena (Germany)
S. Fourmaux, Ecole Nationale Superieure de Techniques Avancees (France)
Daniele Hulin, Ecole Nationale Superieure de Techniques Avancees (France)
Eckhart Forster, Friedrich-Schiller-Univ. Jena (Germany)
Antoine Rousse, Ecole Nationale Superieure de Techniques Avancees (France)


Published in SPIE Proceedings Vol. 5147:
ALT'02 International Conference on Advanced Laser Technologies
Heinz P. Weber; Vitali I. Konov; Thomas Graf, Editor(s)

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