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Proceedings Paper

A novel geometry for uniform intensity line focus of Gaussian laser beams
Author(s): Prasad A. Naik; Sudhakar R. Kumbhare; Vipul Arora; Ramavtar Joshi; Parshotam Dass Gupta
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Paper Abstract

Gain measurements in x-ray lasers involves monitoring the intensity of lasing transition as a function of line focus length. Having a line focus of variable length with uniform intensity is important in these measurements. In addition, uniform line focusing of Gaussian laser beams has many other applications in material processing, pumping of dye lasers etc. In this paper, we describe a simple technique using a wedge to displace and overlap two halves of a Gaussian laser beam to obtain a uniform intensity line focus. Variation of the line length at a fixed intensity is facilitated by use of appropriate masks. X-ray emission pictures of a line focused laser produced plasma show the effectiveness of this geometry.

Paper Details

Date Published: 12 December 2003
PDF: 5 pages
Proc. SPIE 5228, ECLIM 2002: 27th European Conference on Laser Interaction with Matter, (12 December 2003); doi: 10.1117/12.537395
Show Author Affiliations
Prasad A. Naik, Ctr. for Advanced Technology (India)
Sudhakar R. Kumbhare, Ctr. for Advanced Technology (India)
Vipul Arora, Ctr. for Advanced Technology (India)
Ramavtar Joshi, Ctr. for Advanced Technology (India)
Parshotam Dass Gupta, Ctr. for Advanced Technology (India)


Published in SPIE Proceedings Vol. 5228:
ECLIM 2002: 27th European Conference on Laser Interaction with Matter
Oleg N. Krokhin; Sergey Yu. Gus'kov; Yury A. Merkul'ev, Editor(s)

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