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Proceedings Paper

Study on active probe laser system used for laser plasma diagnostic
Author(s): Xiaodong Yuan; Xiaofeng Wei; Chengcheng Wang; Xinwu Qing; Wu Deng; Bin Xu; Dongbin Jiang; Jun Tang; Huaiting Jia
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Paper Abstract

To measure the temperature and density of electronics in laser plasma accurately, two probe laser systems are built on XG-II laser facility. The one, called UV probe laser system, which can provide the UV laser pulse with duration of 30 ps by cascade Raman compressor after fourth harmonic conversion is used for density measurement of laser plasma. The other one, Thomson scattering system, which can provide the 4 ω laser pulse with energy of 3 - 5J, is now routinely operated for electronics temperature diagnostic in laser plasma. It is the first time that the density and temperature of laser plasma are measured directly by probe laser at the same shot.

Paper Details

Date Published: 12 December 2003
PDF: 8 pages
Proc. SPIE 5228, ECLIM 2002: 27th European Conference on Laser Interaction with Matter, (12 December 2003); doi: 10.1117/12.537293
Show Author Affiliations
Xiaodong Yuan, Tsinghua Univ. (China)
China Academy of Engineering Physics (China)
Xiaofeng Wei, China Academy of Engineering Physics (China)
Chengcheng Wang, China Academy of Engineering Physics (China)
Xinwu Qing, China Academy of Engineering Physics (China)
Wu Deng, China Academy of Engineering Physics (China)
Bin Xu, China Academy of Engineering Physics (China)
Dongbin Jiang, China Academy of Engineering Physics (China)
Jun Tang, China Academy of Engineering Physics (China)
Huaiting Jia, China Academy of Engineering Physics (China)


Published in SPIE Proceedings Vol. 5228:
ECLIM 2002: 27th European Conference on Laser Interaction with Matter
Oleg N. Krokhin; Sergey Yu. Gus'kov; Yury A. Merkul'ev, Editor(s)

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