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Proceedings Paper

Comparison of photon attenuation coefficients (2-150 KeV) for diagnostic imaging simulations
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Paper Abstract

The Radiology Research Laboratory at the Henry Ford Hospital has been involved in modeling x-ray units in order to predict image quality. A critical part of that modeling process is the accurate choice of interaction coefficients. This paper serves as a review and comparison of existing interaction models. Our objective was to obtain accurate and easily calculated interaction coefficients, at diagnostically relevant energies. We obtained data from: McMaster, Lawrence Berkeley Lab data (LBL), XCOM and FFAST Data from NIST, and the EPDL-97 database via LLNL. Our studies involve low energy photons; therefore, comparisons were limited to Coherent (Rayleigh), Incoherent (Compton) and Photoelectric effects, which were summed to determine a total interaction cross section. Without measured data, it becomes difficult to definitively choose the most accurate method. However, known limitations in the McMaster data and smoothing of photo-edge transitions can be used as a guide to establish more valid approaches. Each method was compared to one another graphically and at individual points. We found that agreement between all methods was excellent when away from photo-edges. Near photo-edges and at low energies, most methods were less accurate. Only the Chanter (FFAST) data seems to have consistently and accurately predicted the placement of edges (through M-shell), while minimizing smoothing errors. The EPDL-97 data by LLNL was the best over method in predicting coherent and incoherent cross sections.

Paper Details

Date Published: 6 May 2004
PDF: 12 pages
Proc. SPIE 5368, Medical Imaging 2004: Physics of Medical Imaging, (6 May 2004); doi: 10.1117/12.537097
Show Author Affiliations
Charles W Dodge, Henry Ford Health System (United States)
Michael J. Flynn, Henry Ford Health System (United States)


Published in SPIE Proceedings Vol. 5368:
Medical Imaging 2004: Physics of Medical Imaging
Martin J. Yaffe; Michael J. Flynn, Editor(s)

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