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Proceedings Paper

Potential applications of SMART Layer technology for homeland security
Author(s): Amrita Kumar; H. Felix Wu; Mark Lin; Shawn Beard; Xinlin Qing; Chang Zhang; Michael Hamilton; Roy Ikegami
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Paper Abstract

The SMART Layer (reg. TM) manufactured by Acellent is a thin flexible layer with a network of miniature piezoelectric actuators and sensors that can be embedded inside or mounted onto metal and composite structures to acquire information on structural integrity. Currently, SMART Layers (reg. TM) are used to assess the condition of structures and to monitor impact events. The layers can be used to perform built-in structural inspection by exciting the devices with a periodic or transient burst controlled input and analyzing the corresponding structural response. The technology can also be applied to areas concerned with Homeland Security. For example, the technology can be used for motion monitoring and monitoring of structures used in defense applications. By having a network of sensors that monitor loads on a structure, it is possible to monitor the movement of people by measuring the loads exerted by them. The SMART Layer (reg. TM) technology can be used to enhance the readiness of structures used for homeland defense such as manned and unmanned aircraft, missiles and radar systems. It can also be used to monitor a pipeline network for any terrorist related activity that can potentially damage the pipe system. A brief overview of such potential applications is presented here.

Paper Details

Date Published: 14 July 2004
PDF: 9 pages
Proc. SPIE 5395, Nondestructive Detection and Measurement for Homeland Security II, (14 July 2004); doi: 10.1117/12.537064
Show Author Affiliations
Amrita Kumar, Acellent Technologies, Inc. (United States)
H. Felix Wu, National Institute of Standards and Technology (United States)
Mark Lin, Acellent Technologies, Inc. (United States)
Shawn Beard, Acellent Technologies, Inc. (United States)
Xinlin Qing, Acellent Technologies, Inc. (United States)
Chang Zhang, Acellent Technologies, Inc. (United States)
Michael Hamilton, Acellent Technologies, Inc. (United States)
Roy Ikegami, Acellent Technologies, Inc. (United States)


Published in SPIE Proceedings Vol. 5395:
Nondestructive Detection and Measurement for Homeland Security II
Steven R. Doctor; Yoseph Bar-Cohen; A. Emin Aktan; H. Felix Wu, Editor(s)

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